demetallization process
demetalliseringsproces
undergoing demetallization
undergå demetallisering
prevent demetallization
forhindre demetallisering
demetallization study
studie af demetallisering
post-demetallization treatment
behandling efter demetallisering
demetallization effect
effekt af demetallisering
accelerate demetallization
accelererer demetallisering
demetallization analysis
analyse af demetallisering
initial demetallization
indledende demetallisering
complete demetallization
fuldstændig demetallisering
the circuit board underwent demetallization during the harsh environmental testing.
kretskortet gennemgik demetallisering under de hårde miljøtester.
demetallization of the silicon wafer can significantly impact device performance.
demetallisering af siliciumpladen kan have en betydelig indvirkning på udstyrsprestationen.
preventing demetallization is crucial for long-term reliability in microelectronics.
at forhindre demetallisering er afgørende for langsigtet pålidelighed i mikroelektronik.
we studied the mechanisms behind demetallization in aluminum interconnects.
vi studerede mekanismerne bag demetallisering i aluminiumsforbindelser.
demetallization can be accelerated by elevated temperatures and humidity.
demetallisering kan accelereres af forhøjede temperaturer og fugtighed.
the passivation layer helps to mitigate demetallization effects on the surface.
passiveringslaget hjælper med at mindske demetalliseringens effekter på overfladen.
post-etch demetallization is a common concern in semiconductor manufacturing.
post-etch demetallisering er en almindelig bekymring i halvlederproduktionen.
understanding demetallization pathways is key to designing robust devices.
forståelsen af demetalliseringens forløb er afgørende for at designe robuste enheder.
demetallization testing is a standard procedure in our quality control process.
demetalliseringstest er en standardprocedur i vores kvalitetskontrolproces.
the goal is to minimize demetallization and extend the device lifespan.
formålet er at minimere demetallisering og forlænge enhedens levetid.
electromigration can contribute to demetallization in integrated circuits.
elektromigration kan bidrage til demetallisering i integrerede kredsløb.
demetallization process
demetalliseringsproces
undergoing demetallization
undergå demetallisering
prevent demetallization
forhindre demetallisering
demetallization study
studie af demetallisering
post-demetallization treatment
behandling efter demetallisering
demetallization effect
effekt af demetallisering
accelerate demetallization
accelererer demetallisering
demetallization analysis
analyse af demetallisering
initial demetallization
indledende demetallisering
complete demetallization
fuldstændig demetallisering
the circuit board underwent demetallization during the harsh environmental testing.
kretskortet gennemgik demetallisering under de hårde miljøtester.
demetallization of the silicon wafer can significantly impact device performance.
demetallisering af siliciumpladen kan have en betydelig indvirkning på udstyrsprestationen.
preventing demetallization is crucial for long-term reliability in microelectronics.
at forhindre demetallisering er afgørende for langsigtet pålidelighed i mikroelektronik.
we studied the mechanisms behind demetallization in aluminum interconnects.
vi studerede mekanismerne bag demetallisering i aluminiumsforbindelser.
demetallization can be accelerated by elevated temperatures and humidity.
demetallisering kan accelereres af forhøjede temperaturer og fugtighed.
the passivation layer helps to mitigate demetallization effects on the surface.
passiveringslaget hjælper med at mindske demetalliseringens effekter på overfladen.
post-etch demetallization is a common concern in semiconductor manufacturing.
post-etch demetallisering er en almindelig bekymring i halvlederproduktionen.
understanding demetallization pathways is key to designing robust devices.
forståelsen af demetalliseringens forløb er afgørende for at designe robuste enheder.
demetallization testing is a standard procedure in our quality control process.
demetalliseringstest er en standardprocedur i vores kvalitetskontrolproces.
the goal is to minimize demetallization and extend the device lifespan.
formålet er at minimere demetallisering og forlænge enhedens levetid.
electromigration can contribute to demetallization in integrated circuits.
elektromigration kan bidrage til demetallisering i integrerede kredsløb.
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